Syllabus

• Diffraction - single slit ,double slit, aperture

• Spectrometer-dispersive power of grating

• Michelson interferometer

• Fabry-Perot interferometer

• Laser Beam profile

• Birefringence

• Fourier optics

• Stoke’s parameter

• Faraday effect

• Pockel effect

• Kerr effect

• Characterization of optical sources (LED, LD)

• Characterization of optical detectors (PD, APD)