Course
PostgraduateSemester
ElectivesSubject Code
CHM868Subject Title
Advanced Characterization TechniquesSyllabus
Scanning Probe microscopies- advances STM and AFM for material characterization, X-ray diffraction (XRD); Indexing of XRD patterns, lattice parameter determination, determination of particle size and micro/macro strains, reciprocal lattice, electron diffraction, energy loss spectroscopy, SAXS, XRF. insitu methods in XRD Surface mass spectrometry and mass spec imaging- MALDI, ESI, SIMS, Materials characterization by electrochemical methods; Cyclic voltammetry, electrochemical Impedance spectroscopy: experiment and its applications; Dynamic Light Scattering, Surface plasmon resonance spectroscopy.
Detailed version
Scanning Probe Microscopies: Scanning tunneling microscope (STM)-application in characterization of electronic materials; lithography; and Atomic force microscope (AFM) – lateral force microscopy; phase imaging.
X-ray techniques: X-ray diffraction- Generation and characteristics of x-ray, Lattice planes and Bragg’s law, Theory of diffraction, determination of particle size and micro/macro strains, reciprocal lattice, electron diffraction, energy loss spectroscopy, SAXS, XRF,insitu methods in XRD
Mass spectrometry in materials science: Applications of Matrix assisted laser desorption ionization (MALDI) and electrospray ionization (ESI) in materials science. Surface imaging using mass spectrometry.
Materials characterization by electrochemical methods: Cyclic voltammetry, Electrochemical Impedance spectroscopy: experiment and its applications
Nanomaterial characterization: using Dynamic Light Scattering, Surface plasmon resonance spectroscopy
Text Books
1. Y.Leng, Materials Characterisation: Introduction to Microscopic and Spectroscopic Methods, John Wiley & Sons, 2008.
2. J.C. Vickerman, I. Gilmore, Surface Analysis: The Principal Techniques, 2nd ed., John Wiley & Sons, Inc.2009.
3. H. Bubert, H. Jenett, Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Wiley-VCH, 2002.
4. S. Zhang, L. Li, A. Kumar, Materials Characterisation Techniques, CRC Press, 2008.
5. A.R. Clarke, C.N. Eberhardt, Microscopy Techniques for Material Science, CRC Press, 2002.
6. Allen J. Bard and Larry R. Faulkner, Electrochemical Methods, Fundamentals and Application. Wiley, 2001
7. Compton G. Richard and Craig E. Banks, Understanding Voltammetry (2nd Edition), World Scientific, 2011.
8. Cao, G., Nanostructures and Nanomaterials Synthesis, Properties, and Applications, Imperial College Press, 2004.